Overview of the development of the hottest IC test

  • Detail

Overview of the development of integrated circuit tester

integrated circuit testing is one of the key means to ensure the performance and quality of integrated circuits. IC testing technology is one of the three supporting technologies for the development of IC industry. Therefore, integrated circuit tester (or test system, the same below) as a test category is highly valued by many countries. Over the past 40 years, with the development of integrated circuits to the fourth generation, integrated circuit testers have also developed from the initial testing of small-scale integrated circuits to the testing of medium-sized, large-scale and ultra large-scale integrated circuits. By the 1980s, ultra large-scale integrated circuit testers entered their heyday

The development process of integrated circuit tester can be roughly divided into four times. The first generation began in 1965. The test object is small-scale integrated circuits, and the number of measurable pins is up to 16. The torque detection equipment with guide 5 gold tool has its unique product characteristics: wire connection, toggle switch, button plug-in, digital switch or diode matrix and other methods, compile automatic test sequence, and only measure the DC parameters of IC external pins. The second generation began in 1969. At this time, the development of computers has reached the level suitable for controlling testers. The test objects are extended to medium-sized integrated circuits, and the number of pins can be measured is 24. It can not only test the DC parameters of IC, but also test the logic functions of IC with low-speed graphics. This is a leap. The third generation began in 1972. At this time, the measurement object was extended to large-scale integrated circuits (LSI), and the number of measurable pins reached 60. The most prominent progress was to increase the graphics rate of functional testing to 10MHz. Since 1975, the test objects are large-scale and very large-scale integrated circuits (lsi/vlsi), the number of measurable pins has soared to 128, and the graphics rate of functional test has increased to 20MHz. It can measure not only CMOS circuits, but also TTL and ECL circuits effectively. At this time, as an independent semiconductor automatic test equipment, its software and hardware are quite mature. In 1980, the tester entered the fourth generation. The measuring object is VLSI. The number of pins that can be measured is as high as 256. The speed of functional test graphics is as high as 100MHz. The depth of test graphics can make it truly become the cradle of skilled workers up to 256K. The intelligent level of the tester is further improved. It has the ability to connect with computer aided design (CAD), uses the automatic generation of test graphic vectors, and strengthens the integration of digital system and analog system. Some systems are connected with laser repair and adjustment equipment to correct IC chips such as memory, a/d, d/a, etc. Since fairchart formed the sentry Series in 1970, and then the 3200 series of Tektronix, the A380 series and A300 series of Teradyne, the 8000 Series of Ando electron, the t3100, T320 and t3700 series of aduantest and the q-11 series of megatest have achieved good benefits

now, the function test rate of the tester has reached more than 500MHz, the number of pins that can be measured is up to 1024, and the timing accuracy is ± 55ps. The development speed of the tester is amazing

China began the development of integrated circuit testers in the early 1970s. In the late 1980s, the level of domestic integrated circuit testers, especially their self-designed ability, was greatly improved. The research and test of test theory, test method and test system were re regulated by the state. The protection levels of particulate matter were Kn90, kn95 and kn100, respectively, and a scientific research, design Manufacturing technical team. Domestic research institutes and factories that research or manufacture integrated circuit testers mainly include Institute of computing technology, Chinese Academy of Sciences, Institute of semiconductors, Beijing Institute of automatic testing technology, Guanghua Radio Instrument Factory (767 factory), Beijing Radio Instrument Factory, Beijing scientific power company, etc. In 1986, the Institute of computing technology of the Chinese Academy of Sciences successfully developed ict-2 lsi/visi integrated test system. The functional test rate is 10mhz/20mhz, the number of channels is 48 (128), and OTA (total timing accuracy of the system) ± 2ns. In 1987, Beijing Institute of automatic test technology successfully developed the bc3170 memory test system, with a function test rate of 20MHz and 32 channels. At the same time, Guanghua radio instrument factory launched GH3123 integrated circuit automatic tester, and bc3110x integrated circuit tester of Beijing Institute of automatic test technology was successfully developed. These two kinds of small and medium-sized integrated circuit testing systems using CAT technology mark that the technical level of domestic small and medium-sized integrated circuit testers has entered a new development period and moved towards a practical stage. Then Beijing Keli company developed and produced a test rate of 12.5mhz, 64 channel large-scale digital integrated circuit test system. Shortly thereafter, Guanghua radio instrument factory successfully developed a 16m bit RAM memory tester with a function test rate of 10MHz, and the large-scale test system has made great progress

In 1996, the 3190 digital integrated circuit large-scale test system was jointly developed by the Beijing Institute of automatic test technology, the state-run Guanghua radio instrument factory and the Institute of computing technology of the Chinese Academy of Sciences. The test rate is 40MHz, the number of channels is 64, and the timing accuracy is ± 750ps, reaching the international advanced level in the middle and late 1980s. The domestic integrated circuit tester has reached a new level

although some domestic IC testers are responsible for damage during transportation, there is still a large gap with the international level. Among various models of domestic testers in the market, small and medium-sized ones account for 80%, and only a few use computer-aided testing. Large scale IC test systems ict-2, bc3170, 3190 are not practical due to price, reliability, practicality and other factors. Therefore, large-scale IC testing systems mainly rely on imports to solve domestic scientific research, production and application testing

integrated circuit testers can be divided into digital integrated circuit testers, memory testers, analog and mixed signal circuit testers, test systems and verification systems according to the test categories. Because the test objects, test methods and test contents of these testers are different, the structure, configuration and technical performance of each system are quite different

Copyright © 2011 JIN SHI